Metrics for Benchmarking scRNA-Seq Batch Correction

Evaluate batch effect correction algorithms for scRNA-seq using multiple established methods, including the Adjusted Rand Index, Normalized Mutual Information, Local Inverse Simpson Index, and Silhouette Width. Methods for aggregating and weighing multiple metrics together are also included. For further explanation of methods, see Swamy et al. (2021) .


Reference manual

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0.1.0 by Vinay Swamy, 6 months ago

Browse source code at

Authors: Vinay Swamy [aut, cre] , David McGaughey [aut]

Documentation:   PDF Manual  

GPL-3 license

Imports Rcpp, Matrix, RANN, cluster

Linking to Rcpp, RcppArmadillo

See at CRAN