Fits and compares shared, correlated, additive, zero-inflated promotion
cure-rate, and k-out-of-M one-shot device frailty survival models under Bayesian
Markov chain Monte Carlo (MCMC) and Maximum Likelihood Estimation (MLE) frameworks.
Supports ten baseline hazard distributions (Weibull, Exponential, Generalized
Exponential, Exponential Power, Linear Failure Rate, Generalized Log-Logistic,
Generalized Weibull, Generalized Rayleigh, Weighted Exponential, Extended Weibull)
and eight frailty distributions (Gamma, Inverse Gaussian, Positive Stable,
Compound Poisson, Compound Negative Binomial, Generalized Lindley, Weighted Lindley,
Mixture of Inverse Gaussians). Implements reversed hazard rate (RHR) models for
bivariate left-censored survival data, additive shared frailty models under
random right censoring, and one-shot device reliability analysis. Provides
goodness-of-fit testing, information criteria (AIC, BIC, AICc, HQIC, DIC, EAIC,
EBIC, LPML), convergence diagnostics (Geweke, Gelman-Rubin, Heidelberger-Welch),
Bayes factors, residual analyses, and diagnostic visualizations. Methodologies are
based on Hanagal and Dabade (2013)